| 1 | Inspect silicon wafers, solar cells, and semiconductor structures | Near-IR / SWIR: approximately 0.9–1.7 µm | InGaAs focal-plane array | Silicon becomes increasingly transparent at longer near-IR wavelengths, allowing inspection of features that are difficult to see in visible light. | Pixel pitch, quantum efficiency near 1.3–1.55 µm, spatial resolution, and uniformity correction | Limited sensitivity beyond the detector cutoff; optical materials and coatings must support SWIR transmission. |
| 2 | Sort food, plastics, pharmaceuticals, or agricultural products by material composition | SWIR: approximately 1.0–2.5 µm | Extended-range InGaAs or cooled short-wave infrared detector | Molecular overtones and combination bands in the SWIR can reveal moisture, chemical composition, and material differences. | Spectral response, signal-to-noise ratio, illumination stability, and wavelength calibration | Extended-range detectors generally have higher dark current and may require cooling compared with standard 0.9–1.7 µm devices. |
| 3 | Detect hot surfaces, flames, exhaust plumes, and high-temperature equipment | MWIR: approximately 3–5 µm | InSb or cooled MCT focal-plane array | The 3–5 µm atmospheric window provides strong sensitivity to high-temperature radiation and can reduce the impact of some atmospheric absorption bands. | Noise-equivalent temperature difference, integration time, cooling method, and dynamic range | Cooled operation increases power use, system size, startup time, and maintenance requirements. |
| 4 | Measure surface temperature in buildings, machinery, electrical systems, and human environments | LWIR: approximately 8–14 µm | Uncooled microbolometer array | Most objects near ambient temperature emit substantial thermal radiation in the long-wave infrared region, making this band practical for thermal imaging. | NETD, temperature range, calibration stability, pixel pitch, frame rate, and emissivity compensation | Readings can be affected by surface emissivity, reflected radiation, humidity, viewing angle, and atmospheric transmission. |
| 5 | Image through smoke, haze, or low-visibility conditions | Choice depends on the scene: SWIR 1.4–1.7 µm, MWIR 3–5 µm, or LWIR 8–14 µm | InGaAs, cooled MWIR detector, or uncooled microbolometer | Longer wavelengths can scatter less than visible light, while MWIR and LWIR can also provide thermal contrast when visible contrast is weak. | Atmospheric path length, humidity, aerosol type, thermal contrast, and required frame rate | No single band performs best in every type of smoke, fog, dust, or humidity; field testing is recommended. |
| 6 | Identify gases and chemical leaks | Usually MWIR or LWIR at a gas-specific absorption wavelength | Cooled MCT, quantum cascade laser-based receiver, or multispectral thermal detector | Many gases absorb infrared radiation in narrow spectral regions, allowing selective detection when the sensor is matched to the target gas. | Target absorption line, spectral bandwidth, optical path length, temperature contrast, and detection limit | Gas concentration, wind, background temperature, distance, and atmospheric absorption can strongly influence results. |
| 7 | Perform low-light surveillance or night-time scene imaging | NIR/SWIR: approximately 0.7–1.7 µm; thermal imaging may use 8–14 µm | Silicon, InGaAs, or uncooled microbolometer, depending on the task | NIR and SWIR can use available moonlight or active illumination, while thermal sensors detect emitted heat without requiring visible illumination. | Minimum illumination, active illuminator compatibility, thermal sensitivity, optics, and motion blur | NIR/SWIR systems may require illumination; thermal systems generally provide less texture and lower spatial detail than visible cameras. |
| 8 | Inspect coatings, moisture, and subsurface defects in industrial materials | SWIR: approximately 1.0–2.5 µm, selected according to the material absorption feature | InGaAs or other SWIR focal-plane array | Water and many organic materials exhibit useful absorption features in the SWIR region, which can reveal differences not visible in standard RGB images. | Illumination spectrum, spectral filters, calibration target, working distance, and required contrast | Results depend on surface roughness, reflectivity, sample geometry, and the strength of the material-specific absorption feature. |
| 9 | Monitor mechanical wear, overheating, and electrical faults | LWIR 8–14 µm for ambient-temperature equipment; MWIR for hotter targets | Uncooled microbolometer or cooled MWIR detector | Thermal anomalies often appear as localized temperature differences before visible damage occurs. | Temperature range, NETD, frame rate, focus range, calibration interval, and measurement accuracy | Thermal images show apparent temperature rather than temperature alone; emissivity and reflections must be evaluated. |
| 10 | Choose a general-purpose sensor for a defined measurement environment | Select the narrowest practical band that contains the required spectral information | Detector technology matched to wavelength, temperature, speed, and budget | A wavelength matched to the physical phenomenon improves signal-to-noise ratio and can reduce unnecessary optical and processing complexity. | Required resolution, sensitivity, frame rate, working distance, cooling, environmental rating, and calibration method | A broader spectral range does not automatically provide better results; it can increase cost, noise, data volume, and calibration complexity. |